Autori: Antonakos A
| Naslov | Micro-Raman depth profiling of silicon amorphization induced by high-energy ion channeling implantation (Article) |
| Autori | Eric Marko V Petrovic Srdjan M  Kokkoris M Liarokapis E Antonakos A Telecki Igor N
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| Info | JOURNAL OF RAMAN SPECTROSCOPY, (2013), vol. 44 br. 3, str. 496-500 |
| Projekat | Ministry of Education and Science of Serbia [45006]; European Commission [227012] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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