Naslov
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A Comprehensive Overview of the Temperature-Dependent Modeling of the High-Power GaN HEMT Technology Using mm-Wave Scattering Parameter Measurements (Invited Paper) (Article)
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Autori
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Crupi Giovanni Latino Mariangela Gugliandolo Giovanni Marinkovic Zlatica D Cai Jialin Bosi Gianni Raffo Antonio Fazio Enza Donato Nicola
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Info |
ELECTRONICS, (2023), vol. 12 br. 8, str. -
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Projekat
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Italian Ministry of University and Research (MUR) through the PRIN [2017FL8C9N]; Ministry of Science, Technological Development and Innovations of the Republic of Serbia; GaN4AP (GaN for Advanced Power Applications) project [CUP: B82C21001520008] |
Ispravka
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Web of Science
Članak
Elečas
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