Autori: Carulli Jr John M
Naslov | Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond (Article) |
Autori | Huang Ke Liu Yu Korolija Nenad Carulli Jr John M Makris Yiorgos |
Info | IEEE DESIGN & TEST, (2024), vol. 41 br. 2, str. 15-22 |
Ispravka | Web of Science Članak Elečas Rang časopisa |
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