Autori: Michalas L
| Naslov | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
| Autori | Kouvatsos DN Davidovic Vojkan S  Papaioannou GJ Stojadinovic Ninoslav D Michalas L Exarchos M Voutsas AT Goustouridis D
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| Info | MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 9-11, str. 1631-1636 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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