Autori: Olsen SH
| Naslov | A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics (Article) |
| Autori | Kwa KSK Chattopadhyay S Jankovic Nebojsa D Olsen SH Driscoll LS O'Neill AG |
| Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2003), vol. 18 br. 2, str. 82-87 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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