Autori: Pesic Biljana
Naslov | Simulation of semiconductor bulk trap influence on the electrical characteristics of the n-channel power VDMOS transistor (Article) |
Autori | Aleksic Sanja M Pesic Biljana Pantic Dragan S |
Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 2, str. 124-130 |
Projekat | Ministry of Education and Science of the Republic of Serbia [TR 33035] |
Ispravka | Web of Science Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Design and Optimization of S-Type Thermal Cutoffs (Article) |
Autori | Prijic Aneta P Prijic Zoran D Pesic Biljana Pantic Dragan S Ristic Stojan Mancic Dragan D Petrusic Zoran M |
Info | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, (2008), vol. 31 br. 4, str. 904-912 |
Projekat | Serbian Ministry of Science and Technology |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | A new method of evaluation of liquidus temperatures of ternary alloys (Proceedings Paper) |
Autori | Prijic Aneta P Prijic Zoran D Pesic Biljana |
Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 395-398 |
Ispravka | Web of Science Citati: Web of Science |
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Naslov | Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices (Proceedings Paper) |
Autori | Vracar Ljubomir M Pesic Biljana Stojadinovic Ninoslav D |
Info | Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, (2005), vol. br. , str. 1159-1162 |
Ispravka | Web of Science Citati: Web of Science |
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Naslov | Stress-induced leakage currents in thin silicon dioxide films (Article) |
Autori | Pesic Biljana Vracar Ljubomir M Stojadinovic Ninoslav D Pecovska-Djordjevic M Novkovski N |
Info | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, (2003), vol. 14 br. 10-12, str. 805-807 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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