Autori: Prijic Aneta P
| Naslov | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D Stojadinovic Ninoslav D |
| Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 1, str. 58-66 |
| Projekat | Ministry of Education and Science of the Republic of Serbia [OI171026, TR32026]; Ei PCB Factory, Nis, Serbia |
| Ispravka | Web of Science Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors (Article) |
| Autori | Prijic Aneta P Dankovic Danijel M Vracar Ljubomir M Manic Ivica Dj Prijic Zoran D Stojadinovic Ninoslav D |
| Info | MEASUREMENT SCIENCE & TECHNOLOGY, (2012), vol. 23 br. 8, str. - |
| Projekat | Serbian Ministry of Education and Science[OI171026, TR32026]; Ei PCB Factory, Nis |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Capacitive Pressure Sensing Based Key in PCB Technology for Industrial Applications (Article) |
| Autori | Vracar Ljubomir M Prijic Aneta P Vuckovic Dusan Prijic Zoran D |
| Info | IEEE SENSORS JOURNAL, (2012), vol. 12 br. 5, str. 1496-1503 |
| Projekat | Serbian Ministry of Education and Science[TR32026]; Ei PCB Factory, Nis |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions (Article) |
| Autori | Manic Ivica Dj Dankovic Danijel M Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2011), vol. 51 br. 9-11, str. 1540-1543 |
| Projekat | Ministry of Science of the Republic of Serbia[0171026, TR32026] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D |
| Info | MICROELECTRONICS RELIABILITY, (2010), vol. 50 br. 9-11, str. 1278-1282 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Design and Optimization of S-Type Thermal Cutoffs (Article) |
| Autori | Prijic Aneta P Prijic Zoran D Pesic Biljana Pantic Dragan S  Ristic Stojan Mancic Dragan D Petrusic Zoran M
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| Info | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, (2008), vol. 31 br. 4, str. 904-912 |
| Projekat | Serbian Ministry of Science and Technology |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | A new method of evaluation of liquidus temperatures of ternary alloys (Proceedings Paper) |
| Autori | Prijic Aneta P Prijic Zoran D Pesic Biljana |
| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 395-398 |
| Ispravka | Web of Science Citati: Web of Science |
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