Autori: Ristic Goran S
Naslov | Memory effects in argon, nitrogen, and hydrogen (Article) |
Autori | Pejovic Momcilo M Ristic Goran S ![]() |
Info | IEEE TRANSACTIONS ON PLASMA SCIENCE, (2002), vol. 30 br. 3, str. 1315-1319 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglow (Article) |
Autori | Pejovic Momcilo M Ristic Goran S ![]() ![]() |
Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2002), vol. 35 br. 20, str. 2536-2542 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Gamma-ray irradiation and post-irradiation responses of high dose range RADFETs (Article) |
Autori | Jaksic Aleksandar B Ristic Goran S ![]() |
Info | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (2002), vol. 49 br. 3, str. 1356-1363 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Electrical breakdown in low pressure gases (Review) |
Autori | Pejovic Momcilo M Ristic Goran S ![]() ![]() |
Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2002), vol. 35 br. 10, str. R91-R103 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method (Article) |
Autori | Pejovic Momcilo M Ristic Goran S ![]() |
Info | PHYSICS OF PLASMAS, (2002), vol. 9 br. 1, str. 364-370 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Properties of latent interface-trap buildup in irradiated metal-oxide-semiconductor transistors determined by switched bias isothermal annealing experiments (Article) |
Autori | Jaksic Aleksandar B Pejovic Momcilo M Ristic Goran S ![]() |
Info | APPLIED PHYSICS LETTERS, (2000), vol. 77 br. 25, str. 4220-4222 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method (Article) |
Autori | Pejovic Momcilo M Ristic Goran S ![]() |
Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2000), vol. 33 br. 21, str. 2786-2790 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Isothermal and isochronal annealing experiments on irradiated commercial power VDMOSFETs (Article) |
Autori | Jaksic Aleksandar B Pejovic Momcilo M Ristic Goran S ![]() |
Info | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (2000), vol. 47 br. 3, str. 659-666 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | New experimental evidence of latent interface-trap buildup in power VDMOSFETs (Article) |
Autori | Jaksic Aleksandar B Ristic Goran S ![]() |
Info | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (2000), vol. 47 br. 3, str. 580-586 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Nitrogen-filled tube as a sensor of ionizing radiation (Article) |
Autori | Pejovic Momcilo M Ristic Goran S ![]() |
Info | REVIEW OF SCIENTIFIC INSTRUMENTS, (2000), vol. 71 br. 6, str. 2377-2379 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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