Autori: Vasovic Nikola D
Naslov | Automatic and Reliable Electrical Characterization of MOSFETs (Proceedings Paper) |
Autori | Stamenkovic Zoran Vasovic Nikola D Ristic Goran S |
Info | PROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), (2014), vol. br. , str. 262-265 |
Ispravka | Web of Science Citati: Web of Science |
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Naslov | The fixed oxide trap modelling during isothermal and isochronal annealing of irradiated RADFETs (Article) |
Autori | Ristic Goran S Vasovic Nikola D Jaksic Aleksandar B |
Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2012), vol. 45 br. 30, str. - |
Projekat | Ministry of Education and Science of the Republic of Serbia[III43011]; European Commission[207 122 RADDOS] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | A switching system based on microcontroller for successive applying of MGT and CPT on MOSFETs (Article) |
Autori | Vasovic Nikola D Ristic Goran S |
Info | MEASUREMENT, (2012), vol. 45 br. 7, str. 1922-1926 |
Projekat | Ministry of Science and Technology Development of the Republic of Serbia[43011]; European Commission[207 122 RADDOS] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | A new microcontroller-based RADFET dosimeter reader (Article) |
Autori | Vasovic Nikola D Ristic Goran S |
Info | RADIATION MEASUREMENTS, (2012), vol. 47 br. 4, str. 272-276 |
Projekat | Ministry of Science and Technology Development of the Republic of Serbia[43011]; European Commission[207 122 RADDOS] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | A system for gas electrical breakdown time delay measurements based on a microcontroller (Article) |
Autori | Todorovic Miomir Vasovic Nikola D Ristic Goran S |
Info | MEASUREMENT SCIENCE & TECHNOLOGY, (2012), vol. 23 br. 1, str. - |
Projekat | Ministry of Education and Science of the Republic of Serbia[43011]; European Commission[207 122 RADDOS] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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Naslov | The sensitivity of 100 nm RADFETs with zero gate bias up to dose of 230 Gy(Si) (Article) |
Autori | Ristic Goran S Vasovic Nikola D Kovacevic Milojko S Jaksic Aleksandar B |
Info | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, (2011), vol. 269 br. 23, str. 2703-2708 |
Projekat | Ministry of Education and Science of the Republic of Serbia[11143011]; European Commission[207 122 RADDOS] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Interface and oxide state behaviors of commercial n-channel power MOSFETs during high electric field stress and thermal annealing at 150 degrees C (Article) |
Autori | Ristic Goran S Vasovic Nikola D |
Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2011), vol. 26 br. 8, str. - |
Projekat | Ministry of Science and Technology Development of the Republic of Serbia[43011] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Microcontroller based system for electrical breakdown time delay measurement in gas-filled devices (Article) |
Autori | Pejovic Milic M Denic Dragan B Pejovic Momcilo M Nesic Nikola T Vasovic Nikola D |
Info | REVIEW OF SCIENTIFIC INSTRUMENTS, (2010), vol. 81 br. 10, str. - |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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