Autori: Voutsas AT
| Naslov | Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
| Autori | Davidovic Vojkan S  Kouvatsos DN Stojadinovic Ninoslav D Voutsas AT
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| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1841 -1845 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
| Autori | Kouvatsos DN Davidovic Vojkan S Papaioannou GJ Stojadinovic Ninoslav D Michalas L Exarchos M Voutsas AT Goustouridis D
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| Info | MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 9-11, str. 1631-1636 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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